Festplatte kaputt?

drm

Well-Known Member
Hi!

Nachdem die Festplatte in meinem alten Laptop den Geist aufgegeben hatte, hab ich mir vor zwei Monaten eine SAMSUNG HM160HC (160 GB) bestellt und verbaut. Als einziges System ist OpenBSD 4.9 installiert. Seit ein paar Tagen friert ab und zu einfach der komplette Desktop ein, vor allem wenn ich viele Sachen auf die Festplatte schreibe. Beim Systemstart sind dann beliebige Dateien korrupt.

Hab die Platte gerade mal mit smartctl durchgetestet, und ich denke es sieht nicht gut aus. Allerdings bin ich auch beunruhigt, ob vielleicht an meiner anderen Hardware (ATA-Kabel zur Festplatte?) was kaputt sein könnte, was dann die Festplatten schrottet. Ich glaub zwar nicht dass das möglich wäre, aber nach so kurzer Zeit ist mir noch keine Festplatte kaputt gegangen :D Oder kann der Schaden theoretisch auch von zu langer Lagerung kommen? Es gibt ja kaum noch ATA-Platten, und neue werden wohl nicht mehr hergestellt.

Naja, hier mal die Ausgabe von smartctl -a /dev/wd0c:
Code:
smartctl 5.40 2010-10-16 r3189 [i386-unknown-openbsd4.9] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     SAMSUNG HM160HC
Serial Number:    S12TJDQB317494
Firmware Version: LQ100-10
User Capacity:    160,041,885,696 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 0
Local Time is:    Sat Jun 11 14:15:38 2011 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 128)	The previous self-test completed having
					a test element that failed and the
					device is suspected of having handling
					damage.
Total time to complete Offline 
data collection: 		 (  55) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  55) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       30
  3 Spin_Up_Time            0x0007   252   252   025    Pre-fail  Always       -       2312
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       117
  5 Reallocated_Sector_Ct   0x0033   001   001   010    Pre-fail  Always   FAILING_NOW 996
  7 Seek_Error_Rate         0x000e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   252   252   000    Old_age   Always       -       3
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       66
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       77
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       16
194 Temperature_Celsius     0x0022   121   121   000    Old_age   Always       -       39 (Min/Max 18/46)
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       39
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       4
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       1
200 Multi_Zone_Error_Rate   0x000a   100   100   000    Old_age   Always       -       941
201 Soft_Read_Error_Rate    0x0032   252   252   000    Old_age   Always       -       0
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       90
225 Load_Cycle_Count        0x0032   096   096   000    Old_age   Always       -       48737

SMART Error Log Version: 1
ATA Error Count: 5
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 5 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 20 c0 6f 13 e0  Error: ABRT 32 sectors at LBA = 0x00136fc0 = 1273792

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 c0 6f 13 e0 00      00:02:34.562  READ DMA
  c8 00 20 c0 6c 13 e0 00      00:02:31.250  READ DMA
  c8 00 20 e0 68 13 e0 00      00:02:27.750  READ DMA
  c8 00 20 e0 61 13 e0 00      00:02:26.000  READ DMA
  c8 00 20 a0 5d 13 e0 00      00:02:22.375  READ DMA

Error 4 occurred at disk power-on lifetime: 4 hours (0 days + 4 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 51 80 00 d8 2a e5  Error: ICRC, ABRT 128 sectors at LBA = 0x052ad800 = 86693888

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 00 d8 2a e5 00      04:06:37.187  READ DMA
  ca 00 0c b0 1c 93 e2 00      04:06:35.875  WRITE DMA
  ca 00 20 20 ca 43 e1 00      04:06:35.875  WRITE DMA
  ca 00 20 c0 83 04 e1 00      04:06:35.875  WRITE DMA
  ca 00 20 80 39 d8 e0 00      04:06:35.875  WRITE DMA

Error 3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 20 60 6a 0d e5  Error: ABRT 32 sectors at LBA = 0x050d6a60 = 84765280

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 60 6a 0d e5 00      00:08:38.937  READ DMA
  ca 00 20 a0 32 0d e5 00      00:08:36.812  WRITE DMA
  ca 00 20 a0 32 0d e5 00      00:08:36.812  WRITE DMA
  ca 00 20 e0 69 0d e5 00      00:08:36.812  WRITE DMA
  ca 00 20 60 75 0d e5 00      00:08:36.812  WRITE DMA

Error 2 occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 80 60 19 0b e2  Error: ABRT 128 sectors at LBA = 0x020b1960 = 34281824

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 60 19 0b e2 00      02:18:45.437  READ DMA
  c8 00 20 40 19 0b e2 00      02:18:40.437  READ DMA
  c8 00 40 00 19 0b e2 00      02:18:40.312  READ DMA
  ca 00 20 80 9f c3 e1 00      02:18:40.125  WRITE DMA
  ca 00 20 60 9f c3 e1 00      02:18:40.125  WRITE DMA

Error 1 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 20 e0 aa d8 e0  Error: ABRT 32 sectors at LBA = 0x00d8aae0 = 14199520

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 20 e0 aa d8 e0 00      01:21:34.062  READ DMA
  ca 00 20 60 5a f0 e1 00      01:21:33.625  WRITE DMA
  c8 00 20 a0 4f 19 e0 00      01:21:33.625  READ DMA
  ca 00 20 40 5a f0 e1 00      01:21:33.562  WRITE DMA
  c8 00 20 e0 a8 0c e0 00      01:21:33.562  READ DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: handling damage??  00%         2         0
# 2  Short offline       Completed: handling damage??  00%         1         0

Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed_handling_damage?? [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Raw_Read_Error_Rate liegt bei 30, bei Reallocated_Sector_Ct steht FAILING_NOW und der RAW_VALUE steht bei 996. Bedeutet das, dass keine Reservesektoren mehr angefordert werden können? Hab mal gelesen, dass ca. 1000 Sektoren als Reserve auf der Festplatte liegen? Der Load_Cycle_Count ist für die seltene Benutzung mit 48737 auch schon recht hoch, wahrscheinlich müsste man da wie bei WD-Platten auch das interne Stromsparmanagement abschalten.

Und hier die Ausgabe eines langen Tests (smartctl -t long /dev/wd0c):

Code:
# smartctl -l selftest /dev/wd0c             
smartctl 5.40 2010-10-16 r3189 [i386-unknown-openbsd4.9] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF READ SMART DATA SECTION ===
SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: handling damage??  00%         2         0
# 2  Short offline       Completed: handling damage??  00%         1         0

Wie seht ihr die Lage? Sollte ich die Platte umtauschen oder ist da noch was zu retten?

Viele Grüße,
drm
 
Guck mal eben auf der HP von Samsung, die haben spezielle Tools für ihre Platten. Im Normalfall schmeißen die dann einen Fehlercode aus, die man für die RMA-Nummer benötigt. Dann hast du zumindest schon was in der Hand!
 
Pre-fail-Attribut unterlaufen. Ja, die ist endgültig hinüber. So eine hatte ich vor 2 Wochen auch, aber nicht nach 3 Stunden Betriebszeit :) . RMA beim Händler oder direkt beim Hersteller (nur bei nicht-OEM-Platten).

Gerade neue Platten versagen oft. Da hat man manchmal Pech. Heißt aber nicht unbedingt sofort, dass ALLE schlecht sind, so wie die Doofnasen in Bewertungen das oft meinen.
 
Viel liegt da auch an der oftmals nicht korrekten Handhabung durch die Versender. DHL, UPS, DPD und co schmeißen die Pakete so, dass es nicht mehr schön ist... Da kann man an Polsterung und Schaumstoff reinwerfen, was man will, wenn man Pech hat bringt's dennoch nichts.
 
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