Smartctl

A

Aponogeton

Member
Hallo,
habe auf meinem Acer-Laptop PC-BSD und OpenBSD installiert.Mit einer Ubuntu-Livecd wollte ich mir das ganze mal mit gparted anschauen,doch die Festplatte wurde als leer angezeigt,daraufhin machte ich mal einen Test mit smartmontools:
Code: 
ubuntu@ubuntu:~$ sudo smartctl -s on -a /dev/sda
smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HTS541616J9SA00
Serial Number:    SB2441SJCTL4NE
Firmware Version: SB4OC70P
User Capacity:    160.041.885.696 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 1
Local Time is:    Fri Jul 10 06:51:46 2009 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF ENABLE/DISABLE COMMANDS SECTION ===
SMART Enabled.

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 ( 645) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  83) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   062    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   108   108   040    Pre-fail  Offline      -       4448
  3 Spin_Up_Time            0x0007   229   229   033    Pre-fail  Always       -       1
  4 Start_Stop_Count        0x0012   099   099   000    Old_age   Always       -       2495
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   122   122   040    Pre-fail  Offline      -       39
  9 Power_On_Hours          0x0012   092   092   000    Old_age   Always       -       3751
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       2327
191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       170
193 Load_Cycle_Count        0x0012   087   087   000    Old_age   Always       -       132012
194 Temperature_Celsius     0x0002   141   141   000    Old_age   Always       -       39 (Lifetime Min/Max 14/52)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   253   000    Old_age   Always       -       0
223 Load_Retry_Count        0x000a   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 89 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 89 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 02 b3 9e a1 40

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 02 08 b3 9e a1 40 00      00:12:02.500  READ FPDMA QUEUED
  ef 03 45 00 00 00 40 00      00:12:02.500  SET FEATURES [Set transfer mode]
  c6 00 10 00 00 00 40 00      00:12:02.500  SET MULTIPLE MODE
  ec 00 00 00 00 00 00 00      00:12:02.500  IDENTIFY DEVICE
  2f 00 00 10 00 00 40 ff      00:12:02.500  READ LOG EXT

Error 88 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 02 b3 9e a1 40

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 02 f0 b3 9e a1 40 00      00:10:03.300  READ FPDMA QUEUED
  61 08 c0 bf ab 26 40 00      00:10:03.300  WRITE FPDMA QUEUED
  61 01 a0 ff 32 93 40 00      00:10:03.300  WRITE FPDMA QUEUED
  60 08 b8 6f e4 91 40 00      00:10:03.300  READ FPDMA QUEUED
  60 08 a8 4f 27 90 40 00      00:10:03.300  READ FPDMA QUEUED

Error 87 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 02 b3 9e a1 40

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 02 e0 b3 9e a1 40 00      00:08:02.000  READ FPDMA QUEUED
  60 40 d8 59 05 43 40 00      00:08:02.000  READ FPDMA QUEUED
  61 10 d0 07 24 f1 40 00      00:08:02.000  WRITE FPDMA QUEUED
  61 10 c8 a7 22 f1 40 00      00:08:02.000  WRITE FPDMA QUEUED
  61 10 c0 87 22 f1 40 00      00:08:02.000  WRITE FPDMA QUEUED

Error 86 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 02 b3 9e a1 40

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 02 28 b3 9e a1 40 00      00:05:52.300  READ FPDMA QUEUED
  2f 00 01 10 00 00 40 00      00:05:52.300  READ LOG EXT
  60 02 20 b3 9e a1 40 00      00:05:52.200  READ FPDMA QUEUED
  61 08 18 7f 65 27 40 00      00:05:52.200  WRITE FPDMA QUEUED
  2f 00 01 10 00 00 40 00      00:05:52.200  READ LOG EXT

Error 85 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 02 b3 9e a1 40

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 02 20 b3 9e a1 40 00      00:05:52.200  READ FPDMA QUEUED
  61 08 18 7f 65 27 40 00      00:05:52.200  WRITE FPDMA QUEUED
  2f 00 01 10 00 00 40 00      00:05:52.200  READ LOG EXT
  60 02 08 b2 9e a1 40 00      00:05:52.200  READ FPDMA QUEUED
  2f 00 01 10 00 00 40 00      00:05:52.200  READ LOG EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%      3751         -
# 2  Short offline       Completed without error       00%      3675         -
# 3  Short offline       Completed without error       00%      3592         -
# 4  Short offline       Completed without error       00%      3068         -
# 5  Short offline       Completed without error       00%      2852         -
# 6  Short offline       Completed without error       00%      2624         -
# 7  Short offline       Completed without error       00%      2515         -
# 8  Short offline       Completed without error       00%      2164         -
# 9  Short offline       Completed without error       00%      2164         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 m
Mit einer Knoppicillin-CD dann noch einen Drive-Fitness-Test gemacht,der ohne Resultat blieb,also mit einem guten Ergebnis.
Kann mir vielleicht jemand sagen,wie ich das Ergebnis von smartctl deuten soll?
Vielen Dank
 
Du hast 3 Wertezu jedem Eintrag, wie du siehst: VALUE, WORST und THRESH. Diese Einträge teilen sich noch einmal in 2 Kategorien: Old_age und Pre-fail. Einträge der ersten Kategorie geben nur an, dass die Platte alt wird und haben kaum aussagekraft. Wichtigiger sind die Werte in "Pre-Fail".

VALUE ist der aktuelle Wert, WORST der schlechteste jemals bestimme Wert. THRESH ist ein Wert, den die Platte selbst bestimmt. Fällt WORST unter THRESH bedeutet dies, dass die Platte einen Schlag weghat und kurz davor steht, zu verrecken. Auch wenn VALUE beim Anschauen schon wieder über THRESH liegen mag. In dem Fall löst auch die Warnung auf, er nöld rum, dass deine Platte am krepieren ist. Zumindest machen einige Mainboards es beim Start und Windows macht es auch. Andere Systeme nur, wenn smartd läuft.

Wenn man zu Faul ist, die Werte von hand abzugleichen, steht es auch weiter oben noch einmal: "SMART overall-health self-assessment test result: PASSED" Sprich, es ist alles in Ordnung. Sonst würde dort statt PASSED ein FAILED stehen.

Weiter unten kommen dann ATA-Fehler wie "Error 85 occurred at disk power-on lifetime: 3670 hours (152 days + 22 hours)". Dies bedeutet einfach nur, dass die Platte ein ATA-Kommando nicht erfolgreich durchführen konnte. Da das Kommando z.B. falsch war, er damit nichts anfangen konnte, die Firmware versagt hat, etc. Dies ist weitgehend harmlos, viele Platten zeigen da hunderte Fehler an. Sie können auch durch schlechte Kabel, schlechte Controller, kaputte Treiber, Weltraumstrahlung und so weiter ausgelöst werden. Sprich an sich sind sie nichtssagend. Nur wenn sie sich stark häufen, was hier nicht der Fall ist, sollte man sich Sorgen machen.

Ganz unten sind dann die Ergebnisse der manuell gestarteten Selbsttests: Alle Tests sind vom Typ "Short Offline" gewesen und alle sind fehlerfrei durchgelaufen.
 
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